Focus on Cathodoluminescence and Electron Beam Induced Current of Semiconductor Nanostructures

Focus Collection in the IOP journals Nanotechnology and Nano Express

Guest Editors

Jonas Lähnemann, Paul-Drude-Institut, Germany
Gwénolé Jacopin, CNRS, Institut Néel, France
Rachel Oliver, University of Cambridge, UK

Scope

Cathodoluminescence (CL) spectroscopy and electron beam induced current (EBIC) imaging in scanning and transmission electron microscopes are well-adapted techniques to investigate both the optical and electrical properties of semiconductor nanostructures with an unrivalled spatial resolution. In recent years, the focus of this field has shifted from planar quantum well structures to three-dimensional nanostructures. In this context, the correlation of CL results with EBIC and a variety of other electron microscopy techniques, among them energy-dispersive x-ray spectroscopy as well as electron backscatter diffraction, has resulted in new insights in the chemical or microstructural characteristics of these nanostructures. Furthermore, time-resolved CL measurements are gaining in relevance, and, in this context, CL spectroscopy is also attractive to complement other techniques in characterizing quantum emitter structures.

This focus collection builds upon the successful previous edition published in Nano Express in 2020/2021. The new edition is a joint collection between the journals Nanotechnology and Nano Express and submissions to either of the journals are welcome. This collection complements the 2023 Workshop on Cathodoluminescence and Electron Beam Induced Current of Semiconductor Nanostructures held in Grenoble on March 22-24, but is open to any researcher working with these techniques. It aims at showcasing both recent advances in the CL and EBIC measurement techniques, their correlation with other techniques, as well as the broad range of semiconductor materials they can be applied to.

This focus collection is a joint collection between the journals Nanotechnology and Nano Express.

See also the first edition of this focus collection from 2020/2021.

Submission process

We invite authors to submit original research articles, perspectives, and reviews to this focus collection, which will also feature invited articles. Authors should submit via our online submission form. When submitting please select your article type, and then choose Focus on Cathodoluminescence and Electron Beam Induced Current of Semiconductor Nanostructures. All submitted articles are subject to the same review process and high standard as regular Nanotechnology articles.

The deadline for submissions is 31 October 2023. Nanotechnology publishes focus collections incrementally. This means that articles submitted early will be published as soon as they are accepted and prepared for publication, without being delayed waiting for other papers in the collection. If you are not able to meet the deadline, please let us know.

About the journals

Nanotechnology is IOP's signature journal for the science of nanometre-scale objects, in particular encompassing the understanding of their fundamental physics, chemistry, biology and technology. Articles for this journal must meet the highest scientific quality standards, contain significant and original new science, and make substantial advances in nanoscale science and technology.

Nano Express was launched by IOP in 2020 as open-access sister journal to Nanotechnology. The journal has a similar scope as Nanotechnology, but is less strict on the requirement for novelty, while maintaining high standards on the scientific quality. Note that your country may have transformative agreements with IOP under which publishing fees for Nano Express may be waived.