2nd Workshop on Cathodoluminescence and Electron Beam Induced Current of Semiconductor Nanostructures
Only by invitation
CL spectroscopy and EBIC imaging in scanning and transmission electron microscopes are well-adapted techniques to investigate both the optical and electrical properties of semiconductor nanostructures with an adequate spatial resolution. In recent years, the focus of this field has shifted from planar quantum well structures to three-dimensional nanostructures. In this context, the correlation of cathodoluminescence results with a variety of other electron microscopy techniques, among them energy-dispersive x-ray spectroscopy as well as electron backscatter diffraction, has resulted in new insights in the chemical or microstructural characteristics of these nanostructures.
The workshop will be held in the Néel Institute in Grenoble (google maps link)
Abstract deadline submission
Deadline for abstract submission : Feb. 3, 2023
Registration deadline
The registration for the conference is now open through the workshop website (here) and should be done by March 3, 2023
The organizing committee
Gwénolé Jacopin, Institut Néel, CNRS, France
Fabrice Donatini, Institut Néel, Université Grenoble Alpes, France
Julien Pernot, Institut Néel, Université Grenoble Alpes, France
Jonas Lähnemann, Paul Drude Institute for Solid State Electronics, Germany
Rachel Oliver, Cambridge University, United Kingdom
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